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Pego Electronics (Yi Chun) Company Limited
Pego Electronics-Focus on developing and promoting IEC lab testing equipments
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10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation

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10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation

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Brand Name : PEGO

Model Number : PG-TPB

Certification : Third-lab Calibration Certificate

Place of Origin : China

MOQ : 1set

Price : USD450-600/set

Payment Terms : T/T, Western Union, MoneyGram

Delivery Time : 15 working days

Packaging Details : carton box

Standard : IEC61032, IEC60529

Material : metal and insluating material

Application : accessible probe

Force applied : 10N, 20N, 30N, 40N, 50N

Condition : new

Shippment : by express

HS Code : 9024900000

IP Code : IP2X

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IEC61032 Test Finger Probe Test Probe B Jointed Test Finger 10N Force

1. Introduction of Test Probe B:

The test probe is is design according to IEC61032 figure 2, meet the requirements of UL507, UL1278 figure 8 and EN60529 figure 2. The jointed test finger is intended to verify the basic protection against access to hazardous parts. It is used to verify the protection against access with finger.

2. Specification Jointed Test Finger:

Diameter of dactylogryposis: 12mm Length of dactylogryposis: 80mm
Diameter of baffle: 50mm Length of baffle: 100mm
Material: Insulating material (baffle and handle), metal(dactylogryposis)

3. Key Advantage of Jointed Finger Probe

1) Can pass the calibration from third lab authorized by ISO17025

2) It's fully meets the requirements of IEC61032 and IEC60529 standard

3) Easy operation

4. Picture of IEC61032 Test Finger Probe:

10 N Force Jointed Test Finger , IEC60529 Test Probe B Easy Operation


Product Tags:

ul test finger

      

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